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1 Ergebnisse
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81‐1: Invited Paper: Data Augmentation for Applying Deep Le..:
Xiong, Wei
;
Lee, Janghwan
;
Qu, Shuhui
.
SID Symposium Digest of Technical Papers. 51 (2020) 1 - p. 1210-1213 , 2020
Link:
https://doi.org/10.1002/sdtp.14096
RT Journal T1 <Title>81‐1: Invited Paper: Data Augmentation for Applying Deep Learning to Display Manufacturing Defect Detection</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.14096&Exemplar=1&LAN=DE A1 Xiong, Wei A1 Lee, Janghwan A1 Qu, Shuhui A1 Jang, Wonhyouk PB Wiley YR 2020 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 51 IS 1 SP 1210 OP 1213 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.14096 DO https://doi.org/10.1002/sdtp.14096 SF ELIB - SuUB Bremen
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