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1 Ergebnisse
1
5‐3: Experimental and Physics‐Based Analysis of Leakage Cur..:
Kim, Keunwoo
;
Kim, Hanbit
;
Chu, Jaehwan
...
SID Symposium Digest of Technical Papers. 52 (2021) 1 - p. 37-40 , 2021
Link:
https://doi.org/10.1002/sdtp.14604
RT Journal T1
5‐3: Experimental and Physics‐Based Analysis of Leakage Currents for LTPS TFTs in AMOLED Displays
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.14604&Exemplar=1&LAN=DE A1 Kim, Keunwoo A1 Kim, Hanbit A1 Chu, Jaehwan A1 Thanh, Tien Nguyen A1 Lee, Jaeseob A1 Lee, Dokyeong A1 Kang, Meejae A1 Kim, Doona A1 Kim, Sangsub A1 Sung, Bummo A1 Kwak, Hyena A1 Lee, Yongsu A1 Kang, Taewook A1 Chu, Hyeyong A1 Lee, Changhee A1 Kwag, Jinoh PB Wiley YR 2021 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 52 IS 1 SP 37 OP 40 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.14604 DO https://doi.org/10.1002/sdtp.14604 SF ELIB - SuUB Bremen
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