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1 Ergebnisse
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9‐1: Evaluation of X‐ray Resistance of Submicron‐Size c‐Axi..:
Tsuda, Kazuki
;
Takahashi, Hironobu
;
Hamada, Toshiki
...
SID Symposium Digest of Technical Papers. 53 (2022) 1 - p. 78-81 , 2022
Link:
https://doi.org/10.1002/sdtp.15421
RT Journal T1
9‐1: Evaluation of X‐ray Resistance of Submicron‐Size c‐Axis Aligned Crystalline‐Oxide Semiconductor
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.15421&Exemplar=1&LAN=DE A1 Tsuda, Kazuki A1 Takahashi, Hironobu A1 Hamada, Toshiki A1 Saito, Satoru A1 Baba, Haruyuki A1 Takahashi, Masahiro A1 Obonai, Toshimitsu A1 Koezuka, Junichi A1 Kunitake, Hitoshi A1 Kobayashi, Daisuke A1 Tajima, Michio A1 Yamazaki, Shunpei PB Wiley YR 2022 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 53 IS 1 SP 78 OP 81 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.15421 DO https://doi.org/10.1002/sdtp.15421 SF ELIB - SuUB Bremen
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