I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
P‐59: In‐Fab Raman Spectroscopy for Defect Analysis of Rand..:
Lim, Yong-Woon
;
Kim, Hyo-Jin
;
Jang, Won Hyuk
...
SID Symposium Digest of Technical Papers. 53 (2022) 1 - p. 1264-1267 , 2022
Link:
https://doi.org/10.1002/sdtp.15737
RT Journal T1 <Title>P‐59: In‐Fab Raman Spectroscopy for Defect Analysis of Random Failures</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.15737&Exemplar=1&LAN=DE A1 Lim, Yong-Woon A1 Kim, Hyo-Jin A1 Jang, Won Hyuk A1 Kyeong, Yunyoung A1 Lee, Kyong-Hun A1 Park, Bongjoon A1 Kim, Hyeon Hwan PB Wiley YR 2022 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 53 IS 1 SP 1264 OP 1267 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.15737 DO https://doi.org/10.1002/sdtp.15737 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
