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P‐117: AI Analysis of HOP Circuit Failure and Improvement:
Park, Kyongtea
;
Lee, Jaebok
;
Lee, Keunsoo
SID Symposium Digest of Technical Papers. 53 (2022) 1 - p. 1455-1457 , 2022
Link:
https://doi.org/10.1002/sdtp.15791
RT Journal T1 <Title>P‐117: AI Analysis of HOP Circuit Failure and Improvement</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.15791&Exemplar=1&LAN=DE A1 Park, Kyongtea A1 Lee, Jaebok A1 Lee, Keunsoo PB Wiley YR 2022 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 53 IS 1 SP 1455 OP 1457 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.15791 DO https://doi.org/10.1002/sdtp.15791 SF ELIB - SuUB Bremen
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