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P‐134: Detection of Ion Impurities in Organic Thin Films by..:
Iwata, Takuro
;
Inoue, Masaru
;
Oyabu, Noriaki
..
SID Symposium Digest of Technical Papers. 53 (2022) 1 - p. 1513-1516 , 2022
Link:
https://doi.org/10.1002/sdtp.15807
RT Journal T1 <Title>P‐134: Detection of Ion Impurities in Organic Thin Films by Displacement‐Current Measurement Method</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.15807&Exemplar=1&LAN=DE A1 Iwata, Takuro A1 Inoue, Masaru A1 Oyabu, Noriaki A1 Ohdaira, Keisuke A1 Murata, Hideyuki PB Wiley YR 2022 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 53 IS 1 SP 1513 OP 1516 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.15807 DO https://doi.org/10.1002/sdtp.15807 SF ELIB - SuUB Bremen
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