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1 Ergebnisse
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37‐3: Defect Detection of Micro‐LED Displays by Simultaneou..:
Lim, Mikyung
;
Kim, Jae-Hyun
;
Kim, Kyung-Shik
.
SID Symposium Digest of Technical Papers. 54 (2023) 1 - p. 534-536 , 2023
Link:
https://doi.org/10.1002/sdtp.16611
RT Journal T1 <Title>37‐3: Defect Detection of Micro‐LED Displays by Simultaneous Visual and Thermal Imaging</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.16611&Exemplar=1&LAN=DE A1 Lim, Mikyung A1 Kim, Jae-Hyun A1 Kim, Kyung-Shik A1 Jang, Bongkyun PB Wiley YR 2023 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 54 IS 1 SP 534 OP 536 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.16611 DO https://doi.org/10.1002/sdtp.16611 SF ELIB - SuUB Bremen
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