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1 Ergebnisse
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P‐1.24: Investigation of Abnormal Degradation Behaviors und..:
Jiang, Zhixiong
;
Xu, Hongyuan
;
Song, Yanjun
...
SID Symposium Digest of Technical Papers. 55 (2024) S1 - p. 701-701 , 2024
Link:
https://doi.org/10.1002/sdtp.17180
RT Journal T1 <Title>P‐1.24: Investigation of Abnormal Degradation Behaviors under Negative Bias Stress in a‐Si:H TFTs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.17180&Exemplar=1&LAN=DE A1 Jiang, Zhixiong A1 Xu, Hongyuan A1 Song, Yanjun A1 Hu, Cong A1 Chi, Baolin A1 Sean A1 Dai, Ronglei A1 Su, Zifang A1 Xiao, Juncheng PB Wiley YR 2024 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 55 IS S1 SP 701 OP 701 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.17180 DO https://doi.org/10.1002/sdtp.17180 SF ELIB - SuUB Bremen
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