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1 Ergebnisse
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48‐1: A Data‐Driven Intelligent Stress Monitoring for a Rob..:
Yun, Sung Sik
;
Park, Joonho
;
Seo, Juyeon
..
SID Symposium Digest of Technical Papers. 55 (2024) 1 - p. 642-645 , 2024
Link:
https://doi.org/10.1002/sdtp.17606
RT Journal T1 <Title>48‐1: A Data‐Driven Intelligent Stress Monitoring for a Robust Manufacturing of a Phone Display with the Extremely Narrow Bottom Bezel</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sdtp.17606&Exemplar=1&LAN=DE A1 Yun, Sung Sik A1 Park, Joonho A1 Seo, Juyeon A1 Kim, Seokhwan A1 Kang, Taewook PB Wiley YR 2024 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 55 IS 1 SP 642 OP 645 LK http://dx.doi.org/https://doi.org/10.1002/sdtp.17606 DO https://doi.org/10.1002/sdtp.17606 SF ELIB - SuUB Bremen
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