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1 Ergebnisse
1
In situ measurements of surface homogeneity of optical para..:
Spousta, J.
;
Urbánek, M.
;
Chmelík, R.
...
Surface and Interface Analysis. 34 (2002) 1 - p. 664-667 , 2002
Link:
https://doi.org/10.1002/sia.1383
RT Journal T1 <Title>In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.1383&Exemplar=1&LAN=DE A1 Spousta, J. A1 Urbánek, M. A1 Chmelík, R. A1 Jiruše, J. A1 Zlámal, J. A1 Navrátil, K. A1 Nebojsa, A. A1 Šikola, T. PB Wiley YR 2002 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 34 IS 1 SP 664 OP 667 LK http://dx.doi.org/https://doi.org/10.1002/sia.1383 DO https://doi.org/10.1002/sia.1383 SF ELIB - SuUB Bremen
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