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1 Ergebnisse
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Instrument for thin film diagnostics by UV spectroscopic re..:
Urbánek, M.
;
Spousta, J.
;
Navrátil, K.
...
Surface and Interface Analysis. 36 (2004) 8 - p. 1102-1105 , 2004
Link:
https://doi.org/10.1002/sia.1850
RT Journal T1 <Title>Instrument for thin film diagnostics by UV spectroscopic reflectometry</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.1850&Exemplar=1&LAN=DE A1 Urbánek, M. A1 Spousta, J. A1 Navrátil, K. A1 Szotkowski, R. A1 Chmelík, R. A1 Buček, M. A1 Šikola, T. PB Wiley YR 2004 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 36 IS 8 SP 1102 OP 1105 LK http://dx.doi.org/https://doi.org/10.1002/sia.1850 DO https://doi.org/10.1002/sia.1850 SF ELIB - SuUB Bremen
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