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1 Ergebnisse
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BAM‐L002—a new type of certified reference material for len..:
Senoner, M.
;
Wirth, Th.
;
Unger, W.
...
Surface and Interface Analysis. 36 (2004) 10 - p. 1423-1426 , 2004
Link:
https://doi.org/10.1002/sia.1936
RT Journal T1 <Title>BAM‐L002—a new type of certified reference material for length calibration and testing of lateral resolution in the nanometre range</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.1936&Exemplar=1&LAN=DE A1 Senoner, M. A1 Wirth, Th. A1 Unger, W. A1 Österle, W. A1 Kaiander, I. A1 Sellin, R. L. A1 Bimberg, D. PB Wiley YR 2004 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 36 IS 10 SP 1423 OP 1426 LK http://dx.doi.org/https://doi.org/10.1002/sia.1936 DO https://doi.org/10.1002/sia.1936 SF ELIB - SuUB Bremen
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