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1 Ergebnisse
1
Lateral resolution of secondary ion mass spectrometry–resul..:
Senoner, M.
;
Unger, W. E. S.
Surface and Interface Analysis. 39 (2006) 1 - p. 16-25 , 2006
Link:
https://doi.org/10.1002/sia.2453
RT Journal T1
Lateral resolution of secondary ion mass spectrometry–results of an inter‐laboratory comparison
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.2453&Exemplar=1&LAN=DE A1 Senoner, M. A1 Unger, W. E. S. PB Wiley YR 2006 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 39 IS 1 SP 16 OP 25 LK http://dx.doi.org/https://doi.org/10.1002/sia.2453 DO https://doi.org/10.1002/sia.2453 SF ELIB - SuUB Bremen
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