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Cluster SIMS depth profiling of stereo‐specific PMMA thin f..:
Mahoney, Christine M.
Surface and Interface Analysis. 42 (2010) 8 - p. 1393-1401 , 2010
Link:
https://doi.org/10.1002/sia.3115
RT Journal T1 <Title>Cluster SIMS depth profiling of stereo‐specific PMMA thin films on Si</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.3115&Exemplar=1&LAN=DE A1 Mahoney, Christine M. PB Wiley YR 2010 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 42 IS 8 SP 1393 OP 1401 LK http://dx.doi.org/https://doi.org/10.1002/sia.3115 DO https://doi.org/10.1002/sia.3115 SF ELIB - SuUB Bremen
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