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1 Ergebnisse
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Comparison of electrical properties of HgCdTe subsurface la..:
Berchenko, N.
;
Izhnin, I.
;
Yudenkov, V.
..
Surface and Interface Analysis. 42 (2010) 6-7 - p. 902-905 , 2010
Link:
https://doi.org/10.1002/sia.3496
RT Journal T1 <Title>Comparison of electrical properties of HgCdTe subsurface layers formed by low energy ion beam milling or anodic oxidation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.3496&Exemplar=1&LAN=DE A1 Berchenko, N. A1 Izhnin, I. A1 Yudenkov, V. A1 Pociask, M. A1 Yakovyna, V. PB Wiley YR 2010 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 42 IS 6-7 SP 902 OP 905 LK http://dx.doi.org/https://doi.org/10.1002/sia.3496 DO https://doi.org/10.1002/sia.3496 SF ELIB - SuUB Bremen
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