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Quantification of micro‐area analysis in SIMS:
Seki, Setsuko
;
Tamura, Hifumi
Surface and Interface Analysis. 42 (2010) 10-11 - p. 1585-1588 , 2010
Link:
https://doi.org/10.1002/sia.3578
RT Journal T1 <Title>Quantification of micro‐area analysis in SIMS</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.3578&Exemplar=1&LAN=DE A1 Seki, Setsuko A1 Tamura, Hifumi PB Wiley YR 2010 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 42 IS 10-11 SP 1585 OP 1588 LK http://dx.doi.org/https://doi.org/10.1002/sia.3578 DO https://doi.org/10.1002/sia.3578 SF ELIB - SuUB Bremen
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