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Combined SIMS-SPM instrument for high sensitivity and high-..:
Wirtz, Tom
;
Fleming, Yves
;
Gysin, Urs
...
Surface and Interface Analysis. 45 (2012) 1 - p. 513-516 , 2012
Link:
https://doi.org/10.1002/sia.5010
RT Journal T1 <Title>Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis: Combined SIMS-SPM instrument for high-resolution elemental 3D analysis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.5010&Exemplar=1&LAN=DE A1 Wirtz, Tom A1 Fleming, Yves A1 Gysin, Urs A1 Glatzel, Thilo A1 Wegmann, Urs A1 Meyer, Ernst A1 Maier, Urs A1 Rychen, Jörg PB Wiley YR 2012 SN 0142-2421 JF Surface and Interface Analysis VO 45 IS 1 SP 513 OP 516 LK http://dx.doi.org/https://doi.org/10.1002/sia.5010 DO https://doi.org/10.1002/sia.5010 SF ELIB - SuUB Bremen
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