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1 Ergebnisse
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Application of XPS imaging analysis in understanding interf..:
Piao, Hong
;
Fairley, Neal
;
Walton, John
Surface and Interface Analysis. 45 (2013) 11-12 - p. 1742-1750 , 2013
Link:
https://doi.org/10.1002/sia.5316
RT Journal T1 <Title>Application of XPS imaging analysis in understanding interfacial delamination and X‐ray radiation degradation of PMMA</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.5316&Exemplar=1&LAN=DE A1 Piao, Hong A1 Fairley, Neal A1 Walton, John PB Wiley YR 2013 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 45 IS 11-12 SP 1742 OP 1750 LK http://dx.doi.org/https://doi.org/10.1002/sia.5316 DO https://doi.org/10.1002/sia.5316 SF ELIB - SuUB Bremen
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