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1 Ergebnisse
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Quantitative analysis of helium by post‐ionization method u..:
Yurimoto, Hisayoshi
;
Bajo, Ken‐ichi
;
Sakaguchi, Isao
...
Surface and Interface Analysis. 48 (2016) 11 - p. 1181-1184 , 2016
Link:
https://doi.org/10.1002/sia.6119
RT Journal T1
Quantitative analysis of helium by post‐ionization method using femtosecond laser technique
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.6119&Exemplar=1&LAN=DE A1 Yurimoto, Hisayoshi A1 Bajo, Ken‐ichi A1 Sakaguchi, Isao A1 Suzuki, Taku T. A1 Jurewicz, Amy J. G. A1 Itose, Satoru A1 Uchino, Kiichiro A1 Ishihara, Morio PB Wiley YR 2016 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 48 IS 11 SP 1181 OP 1184 LK http://dx.doi.org/https://doi.org/10.1002/sia.6119 DO https://doi.org/10.1002/sia.6119 SF ELIB - SuUB Bremen
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