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Hard X‐ray photoelectron spectroscopy study of core level s..:
Romanyuk, Oleksandr
;
Supplie, Oliver
;
Paszuk, Agnieszka
...
Surface and Interface Analysis. 52 (2020) 12 - p. 933-938 , 2020
Link:
https://doi.org/10.1002/sia.6829
RT Journal T1
Hard X‐ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.6829&Exemplar=1&LAN=DE A1 Romanyuk, Oleksandr A1 Supplie, Oliver A1 Paszuk, Agnieszka A1 Stoeckmann, Jan Philipp A1 Wilks, Regan George A1 Bombsch, Jakob A1 Hartmann, Claudia A1 Garcia‐Diez, Raul A1 Ueda, Shigenori A1 Bartoš, Igor A1 Gordeev, Ivan A1 Houdkova, Jana A1 Kleinschmidt, Peter A1 Bär, Marcus A1 Jiříček, Petr A1 Hannappel, Thomas PB Wiley YR 2020 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 52 IS 12 SP 933 OP 938 LK http://dx.doi.org/https://doi.org/10.1002/sia.6829 DO https://doi.org/10.1002/sia.6829 SF ELIB - SuUB Bremen
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