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X‐ray photoelectron spectroscopy characterization of Cu com..:
L'héronde, Maëva
;
Bouttemy, Muriel
;
Mercier‐Bion, Florence
...
Surface and Interface Analysis. 52 (2020) 12 - p. 1011-1016 , 2020
Link:
https://doi.org/10.1002/sia.6850
RT Journal T1
X‐ray photoelectron spectroscopy characterization of Cu compounds for the development of organic protection treatments dedicated to heritage Cu objects preservation
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.6850&Exemplar=1&LAN=DE A1 L'héronde, Maëva A1 Bouttemy, Muriel A1 Mercier‐Bion, Florence A1 Neff, Delphine A1 Apchain, Emilande A1 Etcheberry, Arnaud A1 Dillmann, Philippe PB Wiley YR 2020 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 52 IS 12 SP 1011 OP 1016 LK http://dx.doi.org/https://doi.org/10.1002/sia.6850 DO https://doi.org/10.1002/sia.6850 SF ELIB - SuUB Bremen
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