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1 Ergebnisse
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Improved depth information from routine analysis of the ine..:
Zborowski, Charlotte
;
Tougaard, Sven
Surface and Interface Analysis. 54 (2021) 4 - p. 433-441 , 2021
Link:
https://doi.org/10.1002/sia.7020
RT Journal T1
Improved depth information from routine analysis of the inelastic background of XPS and HAXPES spectra using optimized two‐ and three‐parameter cross‐sections
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.7020&Exemplar=1&LAN=DE A1 Zborowski, Charlotte A1 Tougaard, Sven PB Wiley YR 2021 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 54 IS 4 SP 433 OP 441 LK http://dx.doi.org/https://doi.org/10.1002/sia.7020 DO https://doi.org/10.1002/sia.7020 SF ELIB - SuUB Bremen
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