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HAXPES: Inelastic background for characterization of nanost..:
Tougaard, Sven
Surface and Interface Analysis. 56 (2023) 5 - p. 259-266 , 2023
Link:
https://doi.org/10.1002/sia.7273
RT Journal T1 <Title>HAXPES: Inelastic background for characterization of nanostructured materials</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_sia.7273&Exemplar=1&LAN=DE A1 Tougaard, Sven PB Wiley YR 2023 SN 0142-2421 SN 1096-9918 JF Surface and Interface Analysis VO 56 IS 5 SP 259 OP 266 LK http://dx.doi.org/https://doi.org/10.1002/sia.7273 DO https://doi.org/10.1002/sia.7273 SF ELIB - SuUB Bremen
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