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Examining Different Regimes of Ionization‐Induced Damage in..:
Sequeira, Miguel C.
;
Djurabekova, Flyura
;
Nordlund, Kai
...
Small. 18 (2022) 49 - p. , 2022
Link:
https://doi.org/10.1002/smll.202270265
RT Journal T1
Examining Different Regimes of Ionization‐Induced Damage in GaN Through Atomistic Simulations (Small 49/2022)
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_smll.202270265&Exemplar=1&LAN=DE A1 Sequeira, Miguel C. A1 Djurabekova, Flyura A1 Nordlund, Kai A1 Mattei, Jean‐Gabriel A1 Monnet, Isabelle A1 Grygiel, Clara A1 Alves, Eduardo A1 Lorenz, Katharina PB Wiley YR 2022 SN 1613-6810 SN 1613-6829 JF Small VO 18 IS 49 LK http://dx.doi.org/https://doi.org/10.1002/smll.202270265 DO https://doi.org/10.1002/smll.202270265 SF ELIB - SuUB Bremen
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