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Measuring Spatially‐Resolved Potential Drops at Semiconduct..:
Chejarla, Varun Shankar
;
Ahmed, Shamail
;
Belz, Jürgen
...
Small Methods. 7 (2023) 9 - p. , 2023
Link:
https://doi.org/10.1002/smtd.202300453
RT Journal T1
Measuring Spatially‐Resolved Potential Drops at Semiconductor Hetero‐Interfaces Using 4D‐STEM
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_smtd.202300453&Exemplar=1&LAN=DE A1 Chejarla, Varun Shankar A1 Ahmed, Shamail A1 Belz, Jürgen A1 Scheunert, Jonas A1 Beyer, Andreas A1 Volz, Kerstin PB Wiley YR 2023 SN 2366-9608 SN 2366-9608 JF Small Methods VO 7 IS 9 LK http://dx.doi.org/https://doi.org/10.1002/smtd.202300453 DO https://doi.org/10.1002/smtd.202300453 SF ELIB - SuUB Bremen
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