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1 Ergebnisse
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Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberratio..:
Tsurusawa, Hideyo
;
Uzuhashi, Jun
;
Kozuka, Yusuke
..
Small Methods. , 2024
Link:
https://doi.org/10.1002/smtd.202301425
RT Journal T1
Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_smtd.202301425&Exemplar=1&LAN=DE A1 Tsurusawa, Hideyo A1 Uzuhashi, Jun A1 Kozuka, Yusuke A1 Kimoto, Koji A1 Ohkubo, Tadakatsu PB Wiley YR 2024 SN 2366-9608 SN 2366-9608 JF Small Methods LK http://dx.doi.org/https://doi.org/10.1002/smtd.202301425 DO https://doi.org/10.1002/smtd.202301425 SF ELIB - SuUB Bremen
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