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1 Ergebnisse
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Integrating pattern matching and abstract interpretation fo..:
Nguyen, Thuy
;
Tomita, Takashi
;
Endo, Junpei
.
Software Testing, Verification and Reliability. 31 (2021) 8 - p. , 2021
Link:
https://doi.org/10.1002/stvr.1788
RT Journal T1 <Title>Integrating pattern matching and abstract interpretation for verifying cautions of microcontrollers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_stvr.1788&Exemplar=1&LAN=DE A1 Nguyen, Thuy A1 Tomita, Takashi A1 Endo, Junpei A1 Aoki, Toshiaki PB Wiley YR 2021 SN 0960-0833 SN 1099-1689 JF Software Testing, Verification and Reliability VO 31 IS 8 LK http://dx.doi.org/https://doi.org/10.1002/stvr.1788 DO https://doi.org/10.1002/stvr.1788 SF ELIB - SuUB Bremen
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