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1 Ergebnisse
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Can fault‐exposure‐potential estimates improve the fault de..:
Chen, Wei
;
Untch, Roland H.
;
Rothermel, Gregg
..
Software Testing, Verification and Reliability. 12 (2002) 4 - p. 197-218 , 2002
Link:
https://doi.org/10.1002/stvr.257
RT Journal T1 <Title>Can fault‐exposure‐potential estimates improve the fault detection abilities of test suites?</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1002_stvr.257&Exemplar=1&LAN=DE A1 Chen, Wei A1 Untch, Roland H. A1 Rothermel, Gregg A1 Elbaum, Sebastian A1 von Ronne, Jeffery PB Wiley YR 2002 SN 0960-0833 SN 1099-1689 JF Software Testing, Verification and Reliability VO 12 IS 4 SP 197 OP 218 LK http://dx.doi.org/https://doi.org/10.1002/stvr.257 DO https://doi.org/10.1002/stvr.257 SF ELIB - SuUB Bremen
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