Merkliste 
 1 Ergebnisse 
 
1

Reasons for Resistivity Increase in FR‐EPDM Insulation of C..:

Ohki, Yoshimichi ; Hirai, Naoshi ; Sato, Kosuke.
IEEJ Transactions on Electrical and Electronic Engineering.  18 (2023)  5 - p. 656-664 , 2023