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Characterization of the Metal-Semiconductor Interface for S..:

, In: Nanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology; NATO Science Series II: Mathematics, Physics and Chemistry,
Woodworth, A. A. ; Peng, C. Y. ; Stinespring, C. D.. - p. 387-390 ,
Link: https://doi.org/10.1007/1-4020-3562-4_41