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1 Ergebnisse
1
Failure analysis studies in pseudomorphic SiGe channel p-MO..:
, In:
Springer Proceedings in Physics; Microscopy of Semiconducting Materials
,
Chang, A C K
;
Ross, I M
;
Norris, D J
... - p. 413-416 ,
Link:
https://doi.org/10.1007/3-540-31915-8_88
RT T1 <cTitle>Springer Proceedings in Physics; Microscopy of Semiconducting Materials</cTitle>: T1 <Title>Failure analysis studies in pseudomorphic SiGe channel p-MOSFET devices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_3-540-31915-8_88&Exemplar=1&LAN=DE A1 Chang, A C K A1 Ross, I M A1 Norris, D J A1 Cullis, A G A1 Tang, Y T A1 Cerrina, C A1 Evans, A G R PB Springer Berlin Heidelberg SP 413 OP 416 LK http://dx.doi.org/https://doi.org/10.1007/3-540-31915-8_88 DO https://doi.org/10.1007/3-540-31915-8_88 SF ELIB - SuUB Bremen
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