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(S)TEM Characterisation of InAs/MgO/Co Multilayers:

, In: Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007,
Eustace, D A ; McComb, D W ; Buckle, L... - p. 153-156 ,
Link: https://doi.org/10.1007/978-1-4020-8615-1_32