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EELS and STEM Assessment of Composition Modulation in InAlA..:
, In:
Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007
,
Estradé, S
;
Arbiol, J
;
Peiró, F
- p. 273-276 ,
Link:
https://doi.org/10.1007/978-1-4020-8615-1_60
RT T1 <cTitle>Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007</cTitle>: T1 <Title>EELS and STEM Assessment of Composition Modulation in InAlAs Tensile Buffer Layers of InGaAs /InAlAs /(100)InP Structures</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-1-4020-8615-1_60&Exemplar=1&LAN=DE A1 Estradé, S A1 Arbiol, J A1 Peiró, F PB Springer Netherlands SP 273 OP 276 LK http://dx.doi.org/https://doi.org/10.1007/978-1-4020-8615-1_60 DO https://doi.org/10.1007/978-1-4020-8615-1_60 SF ELIB - SuUB Bremen
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