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1 Ergebnisse
1
Efficient Process Variation Characterization by Virtual Pro..:
, In:
Machine Learning in VLSI Computer-Aided Design
,
Tao, Jun
;
Zhang, Wangyang
;
Li, Xin
... - p. 201-231 , 2019
Link:
https://doi.org/10.1007/978-3-030-04666-8_7
RT T1 <cTitle>Machine Learning in VLSI Computer-Aided Design</cTitle>: T1 <Title>Efficient Process Variation Characterization by Virtual Probe</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-3-030-04666-8_7&Exemplar=1&LAN=DE A1 Tao, Jun A1 Zhang, Wangyang A1 Li, Xin A1 Liu, Frank A1 Acar, Emrah A1 Rutenbar, Rob A. A1 Blanton, Ronald D. A1 Zeng, Xuan PB Springer International Publishing YR 2019 SP 201 OP 231 LK http://dx.doi.org/https://doi.org/10.1007/978-3-030-04666-8_7 DO https://doi.org/10.1007/978-3-030-04666-8_7 SF ELIB - SuUB Bremen
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