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1 Ergebnisse
1
FIMA: Fault Intensity Map Analysis:
, In:
Constructive Side-Channel Analysis and Secure Design; Lecture Notes in Computer Science
,
Ramezanpour, Keyvan
;
Ampadu, Paul
;
Diehl, William
- p. 63-79 , 2019
Link:
https://doi.org/10.1007/978-3-030-16350-1_5
RT T1 <cTitle>Constructive Side-Channel Analysis and Secure Design; Lecture Notes in Computer Science</cTitle>: T1 <Title>FIMA: Fault Intensity Map Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-3-030-16350-1_5&Exemplar=1&LAN=DE A1 Ramezanpour, Keyvan A1 Ampadu, Paul A1 Diehl, William PB Springer International Publishing YR 2019 SP 63 OP 79 LK http://dx.doi.org/https://doi.org/10.1007/978-3-030-16350-1_5 DO https://doi.org/10.1007/978-3-030-16350-1_5 SF ELIB - SuUB Bremen
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