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Analysis of Bridge Defects in STT-MRAM Cells Under Process ..:

, In: VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing Paradigms; IFIP Advances in Information and Communication Technology,
Champac, Victor ; Gomez, Andres ; Forero, Freddy. - p. 207-231 , 2019
Link: https://doi.org/10.1007/978-3-030-23425-6_11