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Analysis of Bridge Defects in STT-MRAM Cells Under Process ..:
, In:
VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing Paradigms; IFIP Advances in Information and Communication Technology
,
Champac, Victor
;
Gomez, Andres
;
Forero, Freddy
. - p. 207-231 , 2019
Link:
https://doi.org/10.1007/978-3-030-23425-6_11
RT T1
VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing Paradigms; IFIP Advances in Information and Communication Technology
: T1
Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection
UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-3-030-23425-6_11&Exemplar=1&LAN=DE A1 Champac, Victor A1 Gomez, Andres A1 Forero, Freddy A1 Roy, Kaushik PB Springer International Publishing YR 2019 SP 207 OP 231 LK http://dx.doi.org/https://doi.org/10.1007/978-3-030-23425-6_11 DO https://doi.org/10.1007/978-3-030-23425-6_11 SF ELIB - SuUB Bremen
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