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1-GRad-TID Effects in 28-nm Device Study for Rad-Hard Analo..:

, In: Next-Generation ADCs, High-Performance Power Management, and Technology Considerations for Advanced Integrated Circuits,
De Matteis, Marcello ; Resta, F. ; Pipino, A.... - p. 299-315 , 2019
Link: https://doi.org/10.1007/978-3-030-25267-0_18