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1 Ergebnisse
1
Introduction:
, In:
Long-Term Reliability of Nanometer VLSI Systems
,
Tan, Sheldon
;
Tahoori, Mehdi
;
Kim, Taeyoung
... - p. 279-304 , 2019
Link:
https://doi.org/10.1007/978-3-030-26172-6_13
RT T1 <cTitle>Long-Term Reliability of Nanometer VLSI Systems</cTitle>: T1 <Title>Introduction</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-3-030-26172-6_13&Exemplar=1&LAN=DE A1 Tan, Sheldon A1 Tahoori, Mehdi A1 Kim, Taeyoung A1 Wang, Shengcheng A1 Sun, Zeyu A1 Kiamehr, Saman PB Springer International Publishing YR 2019 SP 279 OP 304 LK http://dx.doi.org/https://doi.org/10.1007/978-3-030-26172-6_13 DO https://doi.org/10.1007/978-3-030-26172-6_13 SF ELIB - SuUB Bremen
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