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Computer Vision Approaches to Detect Bean Defects:

, In: Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications; Lecture Notes in Computer Science,
Belan, Peterson A. ; de Macedo, Robson A. G. ; de Araújo, Sidnei A. - p. 336-345 , 2019
Link: https://doi.org/10.1007/978-3-030-33904-3_31