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Lock-in Thermography for Non-destructive Testing of 3D Prin..:

, In: Lecture Notes in Electrical Engineering; Sensors and Microsystems,
Boccardi, Simone ; Carlomagno, Giovanni M. ; Del Core, Giuseppe. - p. 149-155 , 2020
Link: https://doi.org/10.1007/978-3-030-37558-4_22