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Evaluation of Technical Damage Caused by Failures of Electr..:

, In: Advances in Intelligent Systems and Computing; Intelligent Computing and Optimization,
Nekrasov, Anton ; Nekrasov, Alexey ; Panchenko, Vladimir - p. 1204-1212 , 2021
Link: https://doi.org/10.1007/978-3-030-68154-8_102