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Comparative Study of Ion-Induced Damage Formation in GaN an..:

, In: Springer Proceedings in Physics; International Youth Conference on Electronics, Telecommunications and Information Technologies,
Karabeshkin, Konstantin V. ; Karaseov, Platon A. ; Struchkov, Andrei I.... - p. 247-253 , 2022
Link: https://doi.org/10.1007/978-3-030-81119-8_26