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Inspection of Lead Frame Defects Using Deep CNN and Cycle-C..:

, In: Intelligent Systems Reference Library; Generative Adversarial Learning: Architectures and Applications,
Juang, Chia-Feng ; Chen, Wei-Shane - p. 185-203 , 2022
Link: https://doi.org/10.1007/978-3-030-91390-8_9