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Lifetime Reliability Improvement of Pulsed Flip-Flops:
, In:
Lifetime Reliability-aware Design of Integrated Circuits
,
Raji, Mohsen
;
Ghavami, Behnam
- p. 37-50 , 2022
Link:
https://doi.org/10.1007/978-3-031-15345-7_3
RT T1 <cTitle>Lifetime Reliability-aware Design of Integrated Circuits</cTitle>: T1 <Title>Lifetime Reliability Improvement of Pulsed Flip-Flops</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-3-031-15345-7_3&Exemplar=1&LAN=DE A1 Raji, Mohsen A1 Ghavami, Behnam PB Springer International Publishing YR 2022 SP 37 OP 50 LK http://dx.doi.org/https://doi.org/10.1007/978-3-031-15345-7_3 DO https://doi.org/10.1007/978-3-031-15345-7_3 SF ELIB - SuUB Bremen
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