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1 Ergebnisse
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Gate Sizing-Based Lifetime Reliability Improvement of Integ..:
, In:
Lifetime Reliability-aware Design of Integrated Circuits
,
Raji, Mohsen
;
Ghavami, Behnam
- p. 51-64 , 2022
Link:
https://doi.org/10.1007/978-3-031-15345-7_4
RT T1 <cTitle>Lifetime Reliability-aware Design of Integrated Circuits</cTitle>: T1 <Title>Gate Sizing-Based Lifetime Reliability Improvement of Integrated Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-3-031-15345-7_4&Exemplar=1&LAN=DE A1 Raji, Mohsen A1 Ghavami, Behnam PB Springer International Publishing YR 2022 SP 51 OP 64 LK http://dx.doi.org/https://doi.org/10.1007/978-3-031-15345-7_4 DO https://doi.org/10.1007/978-3-031-15345-7_4 SF ELIB - SuUB Bremen
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