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1 Ergebnisse
1
Evaluating the Future Device Security Risk Indicator for Hu..:
, In:
Security and Trust Management; Lecture Notes in Computer Science
,
Oser, Pascal
;
Engelmann, Felix
;
Lüders, Stefan
. - p. 52-70 , 2023
Link:
https://doi.org/10.1007/978-3-031-29504-1_3
RT T1 <cTitle>Security and Trust Management; Lecture Notes in Computer Science</cTitle>: T1 <Title>Evaluating the Future Device Security Risk Indicator for Hundreds of IoT Devices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-3-031-29504-1_3&Exemplar=1&LAN=DE A1 Oser, Pascal A1 Engelmann, Felix A1 Lüders, Stefan A1 Kargl, Frank PB Springer International Publishing YR 2023 SP 52 OP 70 LK http://dx.doi.org/https://doi.org/10.1007/978-3-031-29504-1_3 DO https://doi.org/10.1007/978-3-031-29504-1_3 SF ELIB - SuUB Bremen
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