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1 Ergebnisse
1
Multibias TCAD Analysis of Trap Dynamics in GaN HEMTs:
, In:
Lecture Notes in Electrical Engineering; Proceedings of SIE 2023
,
Catoggio, E.
;
Donati Guerrieri, S.
;
Bonani, F.
- p. 102-109 , 2023
Link:
https://doi.org/10.1007/978-3-031-48711-8_12
RT T1 <cTitle>Lecture Notes in Electrical Engineering; Proceedings of SIE 2023</cTitle>: T1 <Title>Multibias TCAD Analysis of Trap Dynamics in GaN HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1007_978-3-031-48711-8_12&Exemplar=1&LAN=DE A1 Catoggio, E. A1 Donati Guerrieri, S. A1 Bonani, F. PB Springer Nature Switzerland YR 2023 SP 102 OP 109 LK http://dx.doi.org/https://doi.org/10.1007/978-3-031-48711-8_12 DO https://doi.org/10.1007/978-3-031-48711-8_12 SF ELIB - SuUB Bremen
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