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Estimation of Scattering Loss Due to Sidewall Roughness in ..:

, In: Springer Proceedings in Physics; The Physics of Semiconductor Devices,
Jain, Deepti ; Mahajan, Somna ; Jain, Alok.. - p. 963-966 , 2019
Link: https://doi.org/10.1007/978-3-319-97604-4_146