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Effect of AlGaN Barrier Thickness on Trapping Characteristi..:

, In: Springer Proceedings in Physics; The Physics of Semiconductor Devices,
Chakraborty, Apurba ; Ghosh, Saptarsi ; Das, Subhashis.. - p. 183-186 , 2019
Link: https://doi.org/10.1007/978-3-319-97604-4_28