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A Comparative Study of SiO2:TiO2 Composite and SiO2 Film by..:

, In: Springer Proceedings in Physics; The Physics of Semiconductor Devices,
Chatterjee, Kausturi ; Ray, Soma ; Pal, Baishakhi... - p. 341-347 , 2019
Link: https://doi.org/10.1007/978-3-319-97604-4_52